Novel applications of a focused ion beam workstation for specimen preparation and nanostructuring
- Author
- BIICKINS, Matthias1 ; MAYER, Joachim1
[1] Gemeinschaftslabor für Elektronenmikroskopie der RWTH-Aachen, Ahornstraβe 55, 52074 Aachen, Germany - Source
Praktische Metallographie. = Practical Metallography. 2007, Vol 44, Num 5, pp 244-247, 4 p ; ref : 5 ref
- CODEN
- PMTLA5
- ISSN
- 0032-678X
- Scientific domain
- Metallurgy, welding
- Publisher
- Hanser, München
- Publication country
- Germany
- Document type
- Article
- Language
- English
- Keyword (fr)
- Application Faisceau ionique Préparation échantillon
- Keyword (en)
- Application Ion beam Sample preparation
- Keyword (es)
- Aplicación Haz iónico
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A30 Phase diagrams and microstructures developed by solidification and solid-solid phase transformations / 001B80A30F Solidification
- Discipline
- Physics and materials science
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 18756156
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.3139/147.100342 
https://dx.doi.org/10.3139/147.100342
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