Comparing reliability -redundancy tradeoffs for two von neumann multiplexing architectures
- Author
- BHADURI, Debayan1 ; SHUKIA, Sandeep1 ; GRAHAM, Paul2 ; GOKHALE, Maya2
[1] Department of Electrical and Computer Engineering, Virginia Tech, Blacksburg, VA, United States
[2] Los Alamos National Laboratory, Los Alamos, NM, United States - Source
IEEE transactions on nanotechnology. 2007, Vol 6, Num 3, pp 265-279, 15 p ; ref : 40 ref
- ISSN
- 1536-125X
- Scientific domain
- Electronics; Nanotechnologies, nanostructures, nanoobjects; Optics
- Publisher
- Institute of Electrical and Electronics Engineers, New York, NY
- Publication country
- United States
- Document type
- Article
- Language
- English
- Author keyword
- Fault-tolerance interconnect majority multiplexing nanotechnology noise probabilistic model checking probabilistic transfer matrices probability reliability
- Keyword (fr)
- Approche probabiliste Circuit intégré Défaillance Etude comparative Fiabilité Fonction logique Interconnexion Modèle probabiliste Modélisation Multiplexage Méthode calcul Nanotechnologie Nanoélectronique Système tolérant les pannes Tolérance faute
- Keyword (en)
- Probabilistic approach Integrated circuit Failures Comparative study Reliability Logical function Interconnection Probabilistic model Modeling Multiplexing Computing method Nanotechnology Nanoelectronics Fault tolerant system Fault tolerance
- Keyword (es)
- Enfoque probabilista Circuito integrado Fallo Estudio comparativo Fiabilidad Función lógica Interconexión Modelo probabilista Modelización Multiplaje Método cálculo Nanotecnología Nanoelectrónica Sistema tolerando faltas Tolerancia falta
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits / 001D03F06A Design. Technologies. Operation analysis. Testing
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F18 Molecular electronics, nanoelectronics
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 18781781
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1109/TNANO.2007.891504 
https://dx.doi.org/10.1109/TNANO.2007.891504
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