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Reduction of ion energies from a multicomponent Z-pinch plasma

Author
RUZIC, David N1 ; THOMPSON, Keith C1 ; JURCZYK, Brian E1 ; ANTONSEN, Erik L1 ; SRIVASTAVA, Shailendra N1 ; SPENCER, Josh B1
[1] Plasma Material Interaction Group, University of Illinois, Urbana, IL 61801, United States
Source

IEEE transactions on plasma science. 2007, Vol 35, Num 3, pp 606-613, 8 p ; ref : 30 ref.'

CODEN
ITPSBD
ISSN
0093-3813
Scientific domain
Nuclear physics; Plasma physics
Publisher
Institute of Electrical and Electronics Engineers, New York, NY
Publication country
United States
Document type
Article
Language
English
Author keyword
EUV lithography Z-pinch plasma ion acceleration multicomponent plasma
Keyword (fr)
Accélération particule Confinement inertiel plasma Confinement plasma Durée vie Dynamique plasma Erosion Etude expérimentale Explosion coulombienne Facteur réflexion Flux ion Ion lourd Lithographie UV Plasma composite Rugosité Striction longitudinale Xénon 5258L
Keyword (en)
Particle acceleration Plasma inertial confinement Plasma confinement Lifetime Plasma dynamics Erosion Experimental study Coulomb explosion Reflectivity Ion flux Heavy ions Ultraviolet lithography Multicomponent plasma Roughness Longitudinal pinch Xenon
Keyword (es)
Aceleración partícula Dinámica plásmica Explosión coulombiana
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B50 Physics of gases, plasmas and electric discharges / 001B50B Physics of plasmas and electric discharges / 001B50B58 Other confinement methods / 001B50B58L Z-pinches, plasma focus and other pinch devices

Discipline
Physics of gases, plasmas and electric discharges
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
18877831

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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