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Sn-Zn low temperature solder

Author
SUGANUMA, Katsuaki1 ; KIM, Kuen-Soo1
[1] Institute of Scientific & Industrial Research, Osaka University, Mihogaoka 8-1, Ibaraki, Osaka 567-0047, Japan
Issue title
Lead-free electronic solders
Author (monograph)
SUBRAMANIAN, K. N (Editor)1
[1] Department of Chemical Engineering and Materials Sciences, Michigan State University, East Lansing, MI 48824-1226, United States
Source

Journal of materials science. Materials in electronics. 2007, Vol 18, Num 1-3, pp 121-127, 7 p ; ref : 13 ref

ISSN
0957-4522
Scientific domain
Electronics; Condensed state physics
Publisher
Springer, Norwell, MA
Publication country
United States
Document type
Article
Language
English
Keyword (fr)
Alliage eutectique Assemblage brasage tendre Assemblage circuit intégré Endommagement Fiabilité Industrie électronique Propriété chimique Propriété matériau Propriété physique Stabilité chimique Traitement matériau Zinc Zn
Keyword (en)
Eutectic alloy Soldered joint Integrated circuit bonding Damaging Reliability Electronics industry Chemical properties Properties of materials Physical properties Chemical stability Material processing Zinc
Keyword (es)
Aleación eutéctica Junta soldada Deterioración Fiabilidad Industria electrónica Propiedad química Propiedad material Propiedad física Estabilidad química Tratamiento material Zinc
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03A General (including economical and industrial fields)

Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03C Materials

Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits / 001D03F06A Design. Technologies. Operation analysis. Testing

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
18879452

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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