Magnetisation reversal of epitaxial films of γ'-Fe4N on Cu(100)
- Author
- ECIJA, D1 ; JIMENEZ, E1 ; CAMARERO, J1 ; GALLEGO, J. M2 ; VOGEL, J3 ; MIKUSZEIT, N1 ; SACRISTAN, N1 ; MIRANDA, R1
[1] Departamento de Física de la Materia Condensada, Universidad Autànoma de Madrid, Cantoblanco 28049, Spain
[2] Instituto de Ciencia de Materiales de Madrid, Centra Superiror de Investigaciones Científicas, ICMM-CSIC, Madrid, Spain
[3] Institut Néel-CNRS, B.P. 166, 38042 Grenoble, France - Conference title
- Proceedings of the Joint European Magnetic Symposia (JEMS'06), San Sebastian, 26-30 June 2006
- Conference name
- JEMS'06 : Joint European Magnetic Symposia (3 ; San Sebastian 2006-06-26)
- Author (monograph)
- PANINA, Larissa (Editor)1 ; ZHUKOV, A (Editor)2 ; GONZALEZ, Julián (Editor)2 ; FASSBENDER, J (Editor); THOMPSON, S (Editor); SCHREFL, T (Editor); VARGA, R (Editor); BERTOTTI, G (Editor)
[1] Department of Communication and Electrical Engineering, University of Plymouth, Drake Circus, Plymouth, Devon PL4 8AA, United Kingdom
[2] University of the Basque Country, San Sebastián, Spain - Source
Journal of magnetism and magnetic materials. 2007, Vol 316, Num 2, pp 321-324, 4 p ; ref : 10 ref
- CODEN
- JMMMDC
- ISSN
- 0304-8853
- Scientific domain
- Electronics; Condensed state physics
- Publisher
- Elsevier Science, Amsterdam
- Publication country
- Netherlands
- Document type
- Conference Paper
- Language
- English
- Author keyword
- Epitaxial growth Iron nitride Kerr effect Magnetisation reversal STM
- Keyword (fr)
- Aimantation Couche mince Couche épitaxique Diffraction électron Effet Kerr Fer nitrure Hystérésis magnétique Interface Inversion aimantation Matériau ferromagnétique Microscopie tunnel balayage Mécanisme croissance Spectrométrie Auger Variation angulaire 7570A Microscopie électron lent
- Keyword (en)
- Magnetization Thin films Epitaxial layers Electron diffraction Kerr effect Iron nitrides Magnetic hysteresis Interfaces Magnetization reversal Ferromagnetic materials Scanning tunneling microscopy Growth mechanism AES Angular variation Low energy electron microscopy
- Keyword (es)
- Mecanismo crecimiento Variación angular
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70E Magnetic properties and materials / 001B70E70 Magnetic properties of surface, thin films and multilayers / 001B70E70A Magnetic properties of monolayers and thin films
- Discipline
- Physics of condensed state : electronic structure, electrical, magnetic and optical properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 18921957
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/j.jmmm.2007.02.187 
https://dx.doi.org/10.1016/j.jmmm.2007.02.187
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