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Numerical simulation of characteristics of near-field microstrip probe having pyramidal shape

Author
LAPCHUK, Anatoly S1 ; YUN, Sang-Kyeong1 ; YURLOV, Victor1 ; SONG, Jong-Hyeong1 ; AN, Seungdo1 ; NEVIRKOVETS, Ivan2
[1] Central R&D Institute, Samsung Electro-Mechanics Company, Ltd, Suwon 442-743, Korea, Republic of
[2] Department of Physics and Astronomy, Northwestern University, Evanston Illinois 60208, United States
Source

Journal of the Optical Society of America. A, Optics, image science, and vision (Print). 2007, Vol 24, Num 8, pp 2407-2417, 11 p ; ref : 17 ref

ISSN
1084-7529
Scientific domain
Electronics; Optics
Publisher
Optical Society of America, Washington, DC
Publication country
United States
Document type
Article
Language
English
Keyword (fr)
Distribution champ Facteur transmission Forme pyramidale Microscopie champ proche Optique champ proche Pointe microscope Résolution spatiale Simulation numérique Stockage optique 0779
Keyword (en)
Field distribution Transmittance Pyramidal shape Scanning probe microscopy Near field optics Microscope tips Spatial resolution Digital simulation Optical storage
Keyword (es)
Distribución campo Factor transmisión Forma piramidal
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G79 Scanning probe microscopes, components and techniques

Discipline
Metrology
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
18929194

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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