Evaluation and testing of semiconductor laser reliability in optic system
- Author
- TANG WENYAN1 ; FAN XIANGUANG1 ; SUN HEYI1
[1] Dept. of Automatic Measurement and Control, PO Box 305, Harbin Institute of Technology, Harbin, 150001, China - Conference title
- Fundamental problems of optoelectronics and microelectronics III (12-14 September 2006, Harbin, China)
- Conference name
- Fundamental problems of optoelectronics and microelectronics. Conference (3 ; Harbin 2006)
- Author (monograph)
- Society of photo-optical instrumentation engineers, United States (Organiser of meeting)
Russian Foundation for Basic Research, Russian Federation (Organiser of meeting) - Source
Proceedings of SPIE, the International Society for Optical Engineering. 2007 ; 2Vol, pp 659505.1-659505.6 ; ref : 5 ref
- CODEN
- PSISDG
- ISSN
- 0277-786X
- ISBN
- 978-0-8194-6727-0
- Scientific domain
- Electronics; Metrology and instrumentation; Optics; Physics
- Publisher
- SPIE, Bellingham WA
- Publication country
- United States
- Document type
- Conference Paper
- Language
- Russian
- Keyword (fr)
- Caractéristique courant tension Evaluation performance Fiabilité Interaction rayonnement matière Laser semiconducteur Mesure automatique Méthode mesure 4255P
- Keyword (en)
- IV characteristic Performance evaluation Reliability Radiation matter interactions Semiconductor lasers Automatic measurement Measuring methods
- Keyword (es)
- Medición automática
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B55 Lasers / 001B40B55P Semiconductor lasers; laser diodes
- Discipline
- Physics : optics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 18937056
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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