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Scattering of electrons in image-potential states by steps

Author
ROTH, M1 ; FAUSTER, T1 ; WEINELT, M2
[1] Lehrstuhl für Festkorperphysik, Universität Erlangen-Nürnberg, Staudtstraße 7, 91058 Erlangen, Germany
[2] Max-Born-Institut, Max-Born-Str. 2A, 12489 Berlin, Germany
Issue title
Special issue Dynamics of electron transfer processes at interfaces
Author (monograph)
ZACHARIAS, H (Editor)1 ; WOLF, M (Editor)2
[1] Westfälische Wilhelms-Universität, Physikalisches Institut, Münster, Germany
[2] Fachbereich Physik, Freie Universität Berlin, Germany
Source

Applied physics. A, Materials science & processing (Print). 2007, Vol 88, Num 3, pp 497-503, 7 p ; ref : 36 ref

ISSN
0947-8396
Scientific domain
Electronics; Optics; Condensed state physics
Publisher
Springer, Berlin
Publication country
Germany
Document type
Article
Language
English
Keyword (fr)
Cuivre Diffusion élastique Diffusion électron Energie liaison Etat électronique surface Potentiel image Processus 2 photons Résolution angulaire Spectre photoélectron Spectre résolution temporelle Transition interbande 7320A
Keyword (en)
Copper Elastic scattering Electron scattering Binding energy Surface electron state Image potential Two-photon processes Angular resolution Photoelectron spectra Time resolved spectra Interband transitions
Keyword (es)
Difusión electrón Estado electrónico superficie Potencial imagen
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70C Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures / 001B70C20 Surface and interface electron states / 001B70C20A Surface states, band structure, electron density of states

Discipline
Physics of condensed state : electronic structure, electrical, magnetic and optical properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
18952199

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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