Noise analysis of fault tolerant active pixel sensors with and without defects
- Author
- LA HAYE, Michelle L1 ; JUNG, Cory1 ; IZADI, Mohammad H1 ; CHAPMAN, Glenn H1 ; KARIM, Karim S1
[1] Simon Fraser University, School of Engineering Science, Bumaby, BC, V5A 1S6, Canada - Conference title
- Sensors, cameras, and systems for scientific / industrial applications VII (17-19 January 2006, San Jose, California USA)
- Conference name
- Sensors, cameras, and systems for scientific / industrial applications (7 ; 2006)
- Author (monograph)
- Blouke, Morley M (Editor)
IS&T-The Society for Imaging Science and Technology, United States (Organiser of meeting)
Society of photo-optical instrumentation engineers, United States (Organiser of meeting) - Source
Proceedings of SPIE, the International Society for Optical Engineering. 2006 ; 1Vol, pp 606804.1-606804.11 ; ref : 11 ref
- CODEN
- PSISDG
- ISSN
- 0277-786X
- ISBN
- 0-8194-6108-3
- Scientific domain
- Electronics; Metrology and instrumentation; Optics; Physics
- Publisher
- SPIE, Bellingham (Wash.)
- Publication country
- United States
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Analyse image Aspect économique Capteur image Capteur mesure Courant photoélectrique Durabilité Eclairement Fabrication industrielle Formation image Packaging électronique Pixel intelligent Pixel Rapport signal bruit Système tolérant les pannes Tolérance faute 0707D 4279P Capteur pixel actif
- Keyword (en)
- Image analysis Economic aspect Image sensors Measurement sensor Photocurrents Durability Illumination Manufacturing Imaging Electronic packaging Smart pixels Pixel Signal-to-noise ratio Fault tolerant system Fault tolerance Active pixel sensor
- Keyword (es)
- Aspecto económico Captador medida Durabilidad Packaging electrónico Pixel Sistema tolerando faltas
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G07 General equipment and techniques / 001B00G07D Sensors (chemical, optical, electrical, movement, gas, etc.); remote sensing
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B79 Optical elements, devices, and systems / 001B40B79P Imaging detectors and sensors
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F16 Imaging devices
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D04 Telecommunications and information theory / 001D04A Information, signal and communications theory / 001D04A04 Signal and communications theory / 001D04A04A Signal, noise / 001D04A04A1 Signal representation. Spectral analysis
- Discipline
- Electronics Metrology Physics : optics Telecommunications and information theory
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 18972085
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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