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Low-refractive-index materials : A new class of optical thin-film materials

Author
SCHUBERT, E. F; KIM, J. K; XI, J.-Q
[1] Future Chips Constellation, 110 Eighth Street, Troy NY 12180, United States
[2] Department of Electrical, Computer, and Systems Engineering, 110 Eighth Street, Troy NY 12180, United States
[3] Department of Physics, Applied Physics, and Astronomy, 110 Eighth Street, Troy NY 12180, United States
[4] Rensselaer Polytechnic Institute, 110 Eighth Street, Troy NY 12180, United States
Issue title
Frontiers in molecular-beam epitaxy toward novel devices
Author (monograph)
GRAHN, Holger T (Editor)1 ; KOCH, Reinhold (Editor)1 ; TRAMPERT, Achim (Editor)1
[1] Paul Drude Institut for Solid State Electronics, Berlin, Germany
Source

Physica status solidi. B. Basic research. 2007, Vol 244, Num 8, pp 3002-3008, 7 p ; ref : 16 ref

CODEN
PSSBBD
ISSN
0370-1972
Scientific domain
Crystallography; Electronics; Nanotechnologies, nanostructures, nanoobjects; Condensed state physics
Publisher
Wiley, Berlin
Publication country
Germany
Document type
Article
Language
English
Keyword (fr)
Application Couche mince Facteur mérite Facteur réflexion Indice réfraction Matériau optique 7866
Keyword (en)
Application Thin films Figure of merit Reflectivity Refractive index Optical materials
Keyword (es)
Aplicación Factor mérito
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70H Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation / 001B70H66 Optical properties of specific thin films

Discipline
Physics of condensed state : electronic structure, electrical, magnetic and optical properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
18981197

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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