70-GHz effective sampling time-base on-chip oscilloscope in CMOS
- Author
- SAFI-HARB, Mona1 ; ROBERTS, Gordon W1
[1] Department of Electrical and Computer Engineering, McGill University, Montreal, QC H3A 2A7, Canada - Conference title
- Special issue on the CICC 2006
- Conference name
- IEEE 2006 Custom Integrated Circuits Conference (CICC) (CICC) (San Jose, CA 2006-09-10)
- Author (monograph)
- KOLAGOTLA, Ravi K (Editor)1 ; INIEWSKI, Krzysztof (Kris) (Editor)2 ; GHARPUREY, Ranjit (Editor)3
Institute of Electrical and Electronics Engineers, New York, NY, United States (Organiser of meeting)
[1] Intel Corporation, Austin, TX 78746, United States
[2] Redlen Technologies Inc., Sidney, BC V8L 5Y8, Canada
[3] University of Texas, Austin, TX 78212, United States - Source
IEEE journal of solid-state circuits. 2007, Vol 42, Num 8, pp 1743-1757, 15 p ; ref : 11 ref
- CODEN
- IJSCBC
- ISSN
- 0018-9200
- Scientific domain
- Electronics
- Publisher
- Institute of Electrical and Electronics Engineers, New York, NY
- Publication country
- United States
- Document type
- Conference Paper
- Language
- English
- Author keyword
- CMOS design-for-test (DfT) embedded test integrated oscilloscope time-base
- Keyword (fr)
- Chronométrie Circuit intégré Conception pour test Diaphonie Dissipation énergie Echantillonnage Interconnexion Mesure vitesse Méthode domaine temps Prototype Système sur puce Taux échantillonnage Technologie MOS complémentaire
- Keyword (en)
- Time measurement Integrated circuit Design for testability Crosstalk Energy dissipation Sampling Interconnection Speed measurement Time domain method Prototype System on a chip Sampling rate Complementary MOS technology
- Keyword (es)
- Cronometría Circuito integrado Diafonía Disipación energía Muestreo Interconexión Medida velocidad Método dominio tiempo Prototipo Sistema sobre pastilla Razón muestreo Tecnología MOS complementario
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03B Testing, measurement, noise and reliability
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits / 001D03F06A Design. Technologies. Operation analysis. Testing
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 18990837
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1109/JSSC.2007.900292 
https://dx.doi.org/10.1109/JSSC.2007.900292
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