A 104-dB dynamic range transimpedance-based CMOS ASIC for tuning fork microgyroscopes
- Author
- SHARMA, Ajit1 ; MOHAMMAD FAISAL ZAMAN1 ; AYAZI, Farrokh1
[1] School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA 30332, United States - Conference title
- Special issue on the CICC 2006
- Conference name
- IEEE 2006 Custom Integrated Circuits Conference (CICC) (CICC) (San Jose, CA 2006-09-10)
- Author (monograph)
- KOLAGOTLA, Ravi K (Editor)1 ; INIEWSKI, Krzysztof (Kris) (Editor)2 ; GHARPUREY, Ranjit (Editor)3
Institute of Electrical and Electronics Engineers, New York, NY, United States (Organiser of meeting)
[1] Intel Corporation, Austin, TX 78746, United States
[2] Redlen Technologies Inc., Sidney, BC V8L 5Y8, Canada
[3] University of Texas, Austin, TX 78212, United States - Source
IEEE journal of solid-state circuits. 2007, Vol 42, Num 8, pp 1790-1802, 13 p ; ref : 29 ref
- CODEN
- IJSCBC
- ISSN
- 0018-9200
- Scientific domain
- Electronics
- Publisher
- Institute of Electrical and Electronics Engineers, New York, NY
- Publication country
- United States
- Document type
- Conference Paper
- Language
- English
- Author keyword
- Capacitive interface circuit input-referred current noise microgyroscope transimpedance
- Keyword (fr)
- Amplificateur Capteur mesure Circuit capacitif Circuit faible bruit Circuit interface Circuit intégré Circuit à la demande Diapason Dispositif microélectromécanique Facteur qualité élevé Gain Gyroscope Implémentation Impédance Mesure vitesse Technologie MOS complémentaire Temps continu Vitesse angulaire 0707D Transimpédance
- Keyword (en)
- Amplifier Measurement sensor Capacitive circuit Low noise circuit Interface circuit Integrated circuit Custom circuit Tuning fork Microelectromechanical device High Q factor Gain Gyroscope Implementation Impedance Speed measurement Complementary MOS technology Continuous time Angular velocity Transimpedance
- Keyword (es)
- Amplificador Captador medida Circuito capacitivo Circuito débil ruido Circuito intercara Circuito integrado Circuito integrato personalizado Diapasón Dispositivo microelectromecánico Factor alta calidad Ganancia Giroscopio Implementación Impedancia Medida velocidad Tecnología MOS complementario Tiempo continuo
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits / 001D03F06A Design. Technologies. Operation analysis. Testing
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F14 Acoustic wave devices, piezoelectric and piezoresistive devices
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F21 Micro- and nanoelectromechanical devices (mems/nems)
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03G Electric, optical and optoelectronic circuits / 001D03G02 Circuit properties / 001D03G02A Electronic circuits / 001D03G02A2 Amplifiers
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 18990841
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1109/JSSC.2007.900282 
https://dx.doi.org/10.1109/JSSC.2007.900282
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