Test et conception de circuits intégrés digitaux : du niveau comportemental au niveau transferts de registres
- Other title
- Test and Design of Digital Integrated Circuits : from Behavioral to Register Transfer Level (en)
- Author
- Pires, Ricardo; Rouzeyre, Bruno (Advisor (for a thesis or dissertation))
Université de Montpellier 2, Montpellier, France (Degree-grantor) - Source
Test et conception de circuits intégrés digitaux : du niveau comportemental au niveau transferts de registres. 1998, 124 p., ref : 50 ref
- Thesis number
- 98 MON2 0041
- Document type
- Thesis (New Ph.D. thesis)
- Language
- French
- Keyword (fr)
- Circuit intégré Circuit numérique Conception Essai Testabilité
- Keyword (en)
- Integrated circuit Digital circuit Design Test Testability
- Keyword (es)
- Circuito integrado Circuito numérico Diseño Ensayo Testabilidad
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits / 001D03F06A Design. Technologies. Operation analysis. Testing
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 189940
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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