Bias sensitive multispectral structures for imaging applications
- Author
- VIEIRA, M1 ; FANTONI, A1 ; FEMANDES, M1 ; LOURO, P1 ; LAVAREDA, G2 3 ; CARVALHO, C. N2 3
[1] Electronics Telecommunication and Computer Department ISEL, R.Conselheiro Emídio Navarro 1, 1949-014 Lisboa, Portugal
[2] DCM-FCT-UNL Quinta da Torre, 2829-516, Caparica, Portugal
[3] C1-1ST Av Rovisco Pais, 1049-001, Lisboa, Portugal - Conference title
- Proceedings of symposium I on thin films for large area electronics: EMRS 2007[2006] conference, Nice, France
- Conference name
- E-MRS 2006 Spring Meeting: Symposium I on Thin Films for Large Area Electronics (Nice 2006-06)
- Author (monograph)
- ROCA I CABAROCCAS, Pere (Editor)1
European Materials Research Society (EMRS), 67037 Strasbourg, France (Organiser of meeting)
[1] LPICM, Ecole Polytechnique, CNRS, 91128 Palaiseau, France - Source
Thin solid films. 2007, Vol 515, Num 19, pp 7566-7570, 5 p ; ref : 9 ref
- CODEN
- THSFAP
- ISSN
- 0040-6090
- Scientific domain
- Crystallography; Electronics; Metallurgy, welding; Condensed state physics
- Publisher
- Elsevier Science, Lausanne
- Publication country
- Switzerland
- Document type
- Conference Paper
- Language
- English
- Author keyword
- Image sensors Modelling and simulation Optical properties a-SiC:H multilayers
- Keyword (fr)
- Capteur Commutation Confinement Couche multimoléculaire Détecteur Eclairement Effet rayonnement Etain oxyde Etude théorique Formation image Hétérostructure Indium oxyde Matériau amorphe hydrogéné Multicouche Optimisation Photodiode Propriété optique Seuil tension Silicium carbure Simulation numérique 0707D 8560D a-Si:H a-SiC:H
- Keyword (en)
- Sensors Switching Confinement Multilayer Detectors Illumination Radiation effects Tin oxides Theoretical study Imaging Heterostructures Indium oxides Amorphous hydrogenated material Multilayers Optimization Photodiodes Optical properties Voltage threshold Silicon carbides Digital simulation
- Keyword (es)
- Capa multimolecular Umbral tensión
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G07 General equipment and techniques / 001B00G07D Sensors (chemical, optical, electrical, movement, gas, etc.); remote sensing
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70H Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation / 001B70H66 Optical properties of specific thin films
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F15 Optoelectronic devices
- Discipline
- Electronics Metrology Physics of condensed state : electronic structure, electrical, magnetic and optical properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 19031607
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/j.tsf.2006.11.149 
https://dx.doi.org/10.1016/j.tsf.2006.11.149
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