Coexistent compressive and tensile strain in Ag thin films on Si(1 1 1)-(7 x 7) surfaces
- Author
- GOSWAM, D. K1 ; BHATTACHARJEE, K1 ; SATPATI, B1 ; ROY, S1 ; KURI, G2 ; SATYAM, P. V1 ; DEV, B. N1 3
[1] Institute of Physics, Sachivalaya Marg, Bhubaneswar 751005, India
[2] Hamburger Synchrotronstrahlungslabor HASYLAB at DESY, Notkestrasse 85, 22607 Hamburg, Germany
[3] Department of Materials Science, Indian Association for the Cultivation of Science, 2A & 2B Raja S. C. Mullick Road, Jadavpur. Kolkata 700032, India - Source
Applied surface science. 2007, Vol 253, Num 23, pp 9142-9147, 6 p ; ref : 24 ref
- Publisher
- Elsevier Science, Amsterdam
- Publication country
- Netherlands
- Document type
- Article
- Language
- English
- Author keyword
- 68.55.Jk; 61.16.Ch; 68.37.Ef; 68.60.Dv Ag films on Si; Coexistent compressive and tensile strain; Si(1 1 1)-(7 x 7) surface; High resolution X-ray diffraction
- Keyword (fr)
- Argent Bicouche Coefficient dilatation thermique Couche mince Degré recouvrement Diffraction RX Déformation mécanique Microscopie tunnel balayage Microscopie électronique transmission Recuit Refroidissement Structure surface Structure îlot Ag
- Keyword (en)
- Silver Bilayers Thermal expansion coefficient Thin films Coverage rate XRD Strains Scanning tunneling microscopy Transmission electron microscopy Annealing Cooling Surface structure Island structure
- Keyword (es)
- Coeficiente dilatación térmica Grado recubrimiento
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H55 Thin film structure and morphology / 001B60H55J Structure and morphology; thickness
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H60 Physical properties of thin films, nonelectronic / 001B60H60B Mechanical and acoustical properties
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 19050003
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/j.apsusc.2007.05.051 
https://dx.doi.org/10.1016/j.apsusc.2007.05.051
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