Computation of 2-D current distribution in superconductors of arbitrary shapes using a new semi-analytical method
- Author
- SIROIS, Frédéric1 ; ROY, Francois2
[1] École Polytechnique de Montréal, Montréal, QC H3C 3A7, Canada
[2] EPFL-LANOS, Ecole Polytechnique Federale de Lausanne, Lausanne 1015, Switzerland - Source
IEEE transactions on applied superconductivity. 2007, Vol 17, Num 3, pp 3836-3845, 10 p ; ref : 18 ref
- ISSN
- 1051-8223
- Scientific domain
- Electronics; Electrical engineering
- Publisher
- Institute of Electrical and Electronics Engineers, New York, NY
- Publication country
- United States
- Document type
- Article
- Language
- English
- Author keyword
- Diffusion processes electromagnetic analysis finite-element methods (FEMs) high-temperature superconductors integral equations numerical analysis
- Keyword (fr)
- Conception compacte Corps forme arbitraire Densité courant Densité flux Distribution courant Electromagnétisme Equation intégrale Flux magnétique Méthode analytique Méthode numérique Méthode élément fini Packaging électronique Potentiel vecteur Problème inverse Processus diffusion Supraconducteur haute température
- Keyword (en)
- Compact design Arbitrary shape body Current density Flux density Current distribution Electromagnetism Integral equation Magnetic flux Analytical method Numerical method Finite element method Electronic packaging Vector potential Inverse problem Diffusion process High temperature superconductor
- Keyword (es)
- Concepción compacta Cuerpo forma arbitraria Densidad corriente Densidad flujo Distribución corriente Electromagnetismo Ecuación integral Flujo magnético Método analítico Método numérico Método elemento finito Packaging electrónico Potencial vector Problema inverso Proceso difusión Supraconductor alta temperatura
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits / 001D03F06A Design. Technologies. Operation analysis. Testing
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 19069545
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1109/TASC.2007.902117 
https://dx.doi.org/10.1109/TASC.2007.902117
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