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Charged defects in chalcogenide vitreous semiconductors studied with combined Raman scattering and PALS methods

Author
KAVETSKYY, T1 ; VAKIV, M1 ; SHPOTYUK, O1
[1] Lviv Institute of Materials of SRC Carat, 202 Stryjska str, Lviv, 79031, Ukraine
Conference title
Proceedings of the 6th European Conference on Luminescent Detectors and Transformers of Ionizing Radiation (LUMDETR 2006)
Conference name
LUMDETR 2006 : European Conference on Luminescent Detectors and Transformers of Ionizing Radiation (6 ; Lviv 2006-06-19)
Author (monograph)
VAKARCHUK, Ivan (Editor); GRINYOV, Boris (Editor)
Source

Radiation measurements. 2007, Vol 42, Num 4-5, pp 712-714, 3 p ; ref : 1/4 p

ISSN
1350-4487
Scientific domain
Geology; Nuclear physics
Publisher
Elsevier, Oxford
Publication country
United Kingdom
Document type
Conference Paper
Language
English
Author keyword
Chalcogenide glasses Charged defects Positron annihilation Raman scattering
Keyword (fr)
Diffusion Rayonnement Spectrométrie Raman Transformation Fourier Annihilation positon PALS Positron Semiconducteur Verre
Keyword (en)
diffusion radiation Raman spectroscopy Fourier transformation
Keyword (es)
Difusión Radiación Espectrometría Raman
Classification
Pascal
001 Exact sciences and technology / 001E Earth, ocean, space / 001E01 Earth sciences / 001E01C Isotope geochemistry. Geochronology / 001E01C02 Geochronology

Discipline
Earth sciences
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
19097751

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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