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Optics of nanogratings

Author
FOLDYNA, M1 2 ; POSTAVA, K1 3 ; OSSIKOVSKI, R2 ; DE MARTINO, A2 ; GARCIA-CAUREL, E2 ; DREVILLON, B2 ; PISTORA, J1 ; YAMAGUCHI, T3
[1] Department of Physics, Technical University Ostrava, 17. listopadu 15, 708 33 Ostrava-Poruba, Czech Republic
[2] Laboratoire de Physique des Interfaces et Couches Minces, Ecole Polytechnique, 911 28 Palaiseau, France
[3] Research Institute of Electronics, Shizuoka University, Johoku 3-5-1, Hamamatsu 432-8011, Japan
Conference title
15th Czech-Polish-Slovak Conference on Wave and Quantum Aspects of Contemporary Optics (11-15 September, 2006, Liberec, Czech Republic)
Conference name
Czech-Polish-Slovak Optical Conference on Wave and Quantum Aspects of Contemporary Optics (15 ; Liberec 2006)
Author (monograph)
Miler, Miroslav (Editor); Senderáková, Dagmar (Editor); Hrabovský, Miroslav (Editor)
Czech and Slovak Society for Photonics (Organiser of meeting)
SPIE Czech and Slovak Chapter (Organiser of meeting)
Society of photo-optical instrumentation engineers, United States (Organiser of meeting)
Source

Proceedings of SPIE, the International Society for Optical Engineering. 2007 ; 1Vol, pp 660903.1-660903.13 ; ref : 43 ref

CODEN
PSISDG
ISSN
0277-786X
ISBN
978-0-8194-6748-5
Scientific domain
Electronics; Optics; Physics
Publisher
SPIE, Bellingham, Washington
Publication country
United States
Document type
Conference Paper
Language
English
Keyword (fr)
Biréfringence Dichroïsme Diffraction onde électromagnétique Ellipsométrie spectroscopique Essai destructif Essai optique Etude théorique Harmonique supérieur Matériau anisotrope Matériau diélectrique Modèle milieu effectif Oscillateur harmonique Polarimétrie Polarisation optique Propriété optique Série Fourier Théorie onde couplée 0760F 4225F 4225L 4279D Nanooptique Sub longueur onde
Keyword (en)
Birefringence Dichroism Electromagnetic wave diffraction Spectroscopic ellipsometry Destructive testing Optical testing Theoretical study Higher harmonic Anisotropic material Dielectric materials Effective medium model Harmonic oscillators Polarimetry Optical polarization Optical properties Fourier series Coupled wave theory Nano-optics Subwavelength
Keyword (es)
Elipsometría espectroscópica Armónica superior Material anisótropo Modelo medio efectivo Teoría onda acoplada
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G60 Optical instruments, equipment and techniques / 001B00G60F Polarimeters and ellipsometers

Pascal
001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B25 Wave optics / 001B40B25F Diffraction and scattering

Pascal
001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B25 Wave optics / 001B40B25L Birefringence

Pascal
001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B79 Optical elements, devices, and systems / 001B40B79D Gratings

Discipline
Metrology Physics : optics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
19103944

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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