Moiré deflectometry used for refractive index measurements
- Author
- KEPRT, J1 ; BARTONEK, L2
[1] Joint Laboratory of Optics of Palacky University and Physical Institute of Academy of Sciences of Czech Republic, 17.listopadu 50, 772 07 Olomouc, Czech Republic
[2] Department of Experimental Physics, Natural Science Faculty of Palacky University, 17.listopadu 50, 772 07 Olomouc, Czech Republic - Conference title
- 15th Czech-Polish-Slovak Conference on Wave and Quantum Aspects of Contemporary Optics (11-15 September, 2006, Liberec, Czech Republic)
- Conference name
- Czech-Polish-Slovak Optical Conference on Wave and Quantum Aspects of Contemporary Optics (15 ; Liberec 2006)
- Author (monograph)
- Miler, Miroslav (Editor); Senderáková, Dagmar (Editor); Hrabovský, Miroslav (Editor)
Czech and Slovak Society for Photonics (Organiser of meeting)
SPIE Czech and Slovak Chapter (Organiser of meeting)
Society of photo-optical instrumentation engineers, United States (Organiser of meeting) - Source
Proceedings of SPIE, the International Society for Optical Engineering. 2007 ; 1Vol, pp 66090Z.1-66090Z.11 ; ref : 8 ref
- CODEN
- PSISDG
- ISSN
- 0277-786X
- ISBN
- 978-0-8194-6748-5
- Scientific domain
- Electronics; Optics; Physics
- Publisher
- SPIE, Bellingham, Washington
- Publication country
- United States
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Autodéfocalisation Autofocalisation optique Autoimagerie Déflectométrie moiré Effet Talbot Frange moiré Indice réfraction Interférométrie optique Mesure indice réfraction Méthode mesure Objet phase Propriété optique Système temps réel 0760L 4230M 4230V 4265J
- Keyword (en)
- Self defocusing Optical self-focusing Self imaging Moire deflectometry Talbot effect Moire fringes Refractive index Light interferometry Refractive index measurement Measuring methods Phase object Optical properties Real time systems
- Keyword (es)
- Autodefocalización Autoformación imagen Deflectometría moaré Objeto fase
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G60 Optical instruments, equipment and techniques / 001B00G60L Interferometers
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B30 Imaging and optical processing / 001B40B30M Speckle and moire patterns
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B30 Imaging and optical processing / 001B40B30V Image forming and processing
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B65 Nonlinear optics / 001B40B65J Beam trapping, self-focusing and defocusing; self-phase modulation
- Discipline
- Metrology Physics : optics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 19103965
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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