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http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=19104105

Incoming database verification and management for mask data preparation

Author
CHEN, Frank F1 ; LEE, Casper W1 ; LIN, Jason C1
[1] Toppan Chunghwa Electronics Corp. 1127-3 Hopin Road, Padeh City, Taoyuan, 334, Taiwan, Province of China
Conference title
Photomask technology 2006 (19-22 September, 2006, Monterey, California, USA)
Conference name
Photomask technology (2006)
Author (monograph)
Martin, Patrick M (Editor); Naber, Robert J (Editor)
Society of photo-optical instrumentation engineers, United States (Organiser of meeting)
Source

Proceedings of SPIE, the International Society for Optical Engineering. 2006 ; 2Vol, pp 63493U.1-63493U.8 ; ref : 2 ref

CODEN
PSISDG
ISSN
0277-786X
ISBN
0-8194-6444-9
Scientific domain
Electronics; Optics; Physics
Publisher
SPIE, Bellingham, Washington
Publication country
United States
Document type
Conference Paper
Language
English
Keyword (fr)
Base donnée Circuit intégré File attente Gestion ressources Processeur Système attente
Keyword (en)
Database Integrated circuit Queue Resource management Processor Queueing system
Keyword (es)
Base dato Circuito integrado Fila espera Gestión recursos Procesador Sistema fila espera
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits / 001D03F06A Design. Technologies. Operation analysis. Testing

Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits / 001D03F06B Integrated circuits by function (including memories and processors)

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
19104105

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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