Efficient approach to improving pattern fidelity with multi OPC model and recipe
- Author
- DO, Munhoe1 ; KANG, Jaehyun1 ; CHOI, Jaeyoung1 ; LEE, Junseok1 ; LEE, Yongsuk1 ; KIM, Keeho1
[1] RET Team, Advanced Nano-tech Development Division, Dongbu Electronics 474-1, Sangwoo-Ri, Gamgok-Myeon, Eumseong-Gun, Chungbuk, 369-852, Korea, Republic of - Conference title
- Photomask technology 2006 (19-22 September, 2006, Monterey, California, USA)
- Conference name
- Photomask technology (2006)
- Author (monograph)
- Martin, Patrick M (Editor); Naber, Robert J (Editor)
Society of photo-optical instrumentation engineers, United States (Organiser of meeting) - Source
Proceedings of SPIE, the International Society for Optical Engineering. 2006 ; 2Vol, pp 63494P.1-63494P.12 ; ref : 6 ref
- CODEN
- PSISDG
- ISSN
- 0277-786X
- ISBN
- 0-8194-6444-9
- Scientific domain
- Electronics; Optics; Physics
- Publisher
- SPIE, Bellingham, Washington
- Publication country
- United States
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Circuit intégré Optimisation Système sur puce Correction optique de proximité
- Keyword (en)
- Integrated circuit Optimization System on a chip Optical proximity correction
- Keyword (es)
- Circuito integrado Optimización Sistema sobre pastilla Corrección de proximidad óptica
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits / 001D03F06A Design. Technologies. Operation analysis. Testing
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 19104132
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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