Automatic fault tree derivation from little-JIL process definitions
- Author
- BIN CHEN1 ; AVRUNIN, George S1 ; CLARKE, Lori A1 ; OSTERWEIL, Leon J1
[1] Department of Computer Science, University of Massachusetts, Amherst, MA 01003, United States - Conference title
- Software process change (international software process workshop and international workshop on software process simulation and modeling)
- Conference name
- Joint Conference of the Software Process Workshop and the International Workshop on Software Process Simulation and Modeling (1 ; Shanghai 2006)
- Source
Lecture notes in computer science. 2006 ; 1Vol, pp 150-158, 9 p ; ref : 11 ref
- ISSN
- 0302-9743
- ISBN
- 3-540-34199-4
- Scientific domain
- Computer science
- Publisher
- Springer, Berlin
- Publication country
- Germany
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Accident Arbre défaut Diagnostic panne Défaut Développement logiciel Endommagement Grosseur grain Système réactif Sécurité
- Keyword (en)
- Accident Fault tree Fault diagnostic Defect Software development Damaging Grain size Reactive system Safety
- Keyword (es)
- Accidente Arbol defecto Diagnóstico pana Defecto Desarrollo logicial Deterioración Grosor grano Sistema reactivo Seguridad
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D02 Computer science; control theory; systems / 001D02B Software / 001D02B09 Software engineering
- Discipline
- Computer science : theoretical automation and systems
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 19105451
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1007/11754305_17 
https://dx.doi.org/10.1007/11754305_17
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