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Recovery of boundary image sticking using aging discharge in AC plasma display panel

Author
PARK, Choon-Sang1 ; TAE, Heung-Sik1 ; KWON, Young-Kuk2 ; EUN GI HEO2
[1] School of Electrical Engineering and Computer Science, Kyungpook National University, Daegu 702-701, Korea, Republic of
[2] Plasma Display Panel Division, Samsung SDI Company, Ltd, Cheonan City 330-300, Korea, Republic of
Source

IEEE transactions on plasma science. 2007, Vol 35, Num 5, pp 1511-1517, 7 p ; 2 ; ref : 12 ref

CODEN
ITPSBD
ISSN
0093-3813
Scientific domain
Nuclear physics; Plasma physics
Publisher
Institute of Electrical and Electronics Engineers, New York, NY
Publication country
United States
Document type
Article
Language
English
Author keyword
.Full-white aging discharge 42-in ac-plasma display panel (PDP) module Vt close curve permanent boundary image sticking redeposition of Mg scanning electron microscope (SEM) analyses time-of-flight secondary ion mass spectrometry (TOF-SIMS)
Keyword (fr)
Dispositif plasma Microscopie électronique balayage Panneau affichage plasma Pulvérisation irradiation Spectrométrie SIMS 5275
Keyword (en)
Plasma devices Scanning electron microscopy Plasma display panel Sputtering Secondary ion mass spectrometry
Keyword (es)
Panel visualización por plasma Espectrometría SIMS
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B50 Physics of gases, plasmas and electric discharges / 001B50B Physics of plasmas and electric discharges / 001B50B75 Plasma devices

Discipline
Physics of gases, plasmas and electric discharges
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
19186285

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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