Observation of singularities in multiply scattered microwave fields
- Author
- SHENG ZHANG1 ; BING HU1 ; LOCKERMAN, Yitzchak1 ; SEBBAH, Patrick1 2 ; GENACK, Azriel Z1
[1] Department of Physics, Queens College of the City University of New York, Flushing, New York 11367, United States
[2] Laboratoire de Physique de la Matière Condensée/CNRS, Université de Nice-Sophia Antipolis, Parc Valrose, 06108 Nice, France - Source
Journal of the Optical Society of America. A, Optics, image science, and vision (Print). 2007, Vol 24, Num 10 ; A33-A38 ; ref : 33 ref
- ISSN
- 1084-7529
- Scientific domain
- Electronics; Optics
- Publisher
- Optical Society of America, Washington, DC
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Diffusion multiple Diffusion onde électromagnétique Hyperfréquence Mesure phase Optique statistique Speckle 4225F 4230M Optique singulière
- Keyword (en)
- Multiple scattering Electromagnetic wave scattering Microwave radiation Phase measurement Statistical optics Speckles Singular optics
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B25 Wave optics / 001B40B25F Diffraction and scattering
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B30 Imaging and optical processing / 001B40B30M Speckle and moire patterns
- Discipline
- Physics : optics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 19194421
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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