Enhanced weak-signal sensitivity in two-photon microscopy by adaptive illumination
- Author
- CHU, Kengyeh K1 ; LIM, Daryl1 ; MERTZ, Jerome1
[1] Department of Biomedical Engineering, Boston University, 44 Cummington Street, Boston, Massachusetts 02215, United States - Source
Optics letters. 2007, Vol 32, Num 19, pp 2846-2848, 3 p ; ref : 5 ref
- CODEN
- OPLEDP
- ISSN
- 0146-9592
- Scientific domain
- Electronics; Optics; Telecommunications
- Publisher
- Optical Society of America, Washington, DC
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Microscopie champ proche Microscopie fluorescence Microscopie optique Optique non linéaire Processus n photons 0779 4265
- Keyword (en)
- Scanning probe microscopy Fluorescence microscopy Optical microscopy Nonlinear optics Multi-photon processes
- Keyword (es)
- Microscopía fluorescencia
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G79 Scanning probe microscopes, components and techniques
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B65 Nonlinear optics
- Discipline
- Metrology Physics : optics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 19198118
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1364/OL.32.002846 
https://dx.doi.org/10.1364/OL.32.002846
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