More on accelerating physical verification using STPRL : a novel language for test pattern generation
- Author
- NOUH, Ahmed1
[1] Mentor Graphics (Egypt) Mentor Consulting Department 51 Beirut St, Heliopolis, Cairo 11341, Egypt - Conference title
- Design for manufacturability through design-process integration (28 February-2 March 2007, San Jose, California, USA)
- Conference name
- Design for manufacturability through design-process integration (San Jose, California 2007)
- Author (monograph)
- Wong, Alfred Kwok-Kit (Editor); Singh, Vivek K (Editor)
Society of photo-optical instrumentation engineers, United States (Organiser of meeting)
International SEMATECH (Organiser of meeting) - Source
Proceedings of SPIE, the International Society for Optical Engineering. 2007, pp 65211T.1-65211T.8 ; ref : 4 ref
- CODEN
- PSISDG
- ISSN
- 0277-786X
- ISBN
- 978-0-8194-6640-2
- Scientific domain
- Electronics; Optics; Physics
- Publisher
- SPIE, Bellingham, Wash
- Publication country
- United States
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Analyse comportementale Conception circuit intégré Conception pour fabrication Endommagement Evaluation performance Générateur forme Génération vecteur test Modélisation
- Keyword (en)
- Behavioral analysis Integrated circuit design Design for manufacture Damaging Performance evaluation Pattern generator Test pattern generation Modeling
- Keyword (es)
- Análisis conductual Deterioración Evaluación prestación Generador forma Generación vector prueba Modelización
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits / 001D03F06A Design. Technologies. Operation analysis. Testing
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 19207481
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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