The application of grey relation close degree model in the fault diagnosis
- Author
- CUIFENG LI1 2 ; WENZHAN DAI2
[1] Net Center of Zhejiang Business Technology Institute, 315012, Ningbo, Zhejiang, China
[2] Electronic Engineering College of Zhejiang Gongshang University, 310035, Hangzhou, Zhejiang, China - Conference title
- Computational intelligence (part II : international conference on intelligent computing, ICIC 2006, Kunming, China, August 16-19, 2006 : proceedings)
- Conference name
- International Conference on Intelligent Computing (Kunming 2006)
- Author (monograph)
- Huang, De-Shuang (Editor); Li, Kang (Editor); Irwin, George William (Editor)
- Source
Lecture notes in computer science. 2006, pp 614-619, 6 p ; ref : 8 ref
- ISSN
- 0302-9743
- ISBN
- 3-540-37274-1
- Scientific domain
- Computer science
- Publisher
- Springer, Berlin
/
Springer, New York
- Publication country
- Germany
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Diagnostic panne Intelligence artificielle Modélisation Système gris Théorie degré
- Keyword (en)
- Fault diagnostic Artificial intelligence Modeling Grey system Degree theory
- Keyword (es)
- Diagnóstico pana Inteligencia artificial Modelización Sistema gris Teoría grado
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D02 Computer science; control theory; systems / 001D02C Artificial intelligence
- Discipline
- Computer science : theoretical automation and systems
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 19308879
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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