Intelligent process trend recognition fault diagnosis and industrial application
- Author
- SIEN LU1 ; BIAO HUANG1
[1] Department of Chemical and Materials Engineering, University of Alberta, Edmonton, Alberta, T6G 2G6, Canada - Conference title
- Computational intelligence (part II : international conference on intelligent computing, ICIC 2006, Kunming, China, August 16-19, 2006 : proceedings)
- Conference name
- International Conference on Intelligent Computing (Kunming 2006)
- Author (monograph)
- Huang, De-Shuang (Editor); Li, Kang (Editor); Irwin, George William (Editor)
- Source
Lecture notes in computer science. 2006, pp 637-642, 6 p ; ref : 6 ref
- ISSN
- 0302-9743
- ISBN
- 3-540-37274-1
- Scientific domain
- Computer science
- Publisher
- Springer, Berlin
/
Springer, New York
- Publication country
- Germany
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Diagnostic panne Détection défaut Intelligence artificielle Modèle Markov caché Modèle Markov Monitorage Reconnaissance forme Surveillance Transformation ondelette
- Keyword (en)
- Fault diagnostic Defect detection Artificial intelligence Hidden Markov model Markov model Monitoring Pattern recognition Surveillance Wavelet transformation
- Keyword (es)
- Diagnóstico pana Detección imperfección Inteligencia artificial Modelo Markov oculto Modelo Markov Monitoreo Reconocimiento patrón Vigilancia Transformación ondita
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D02 Computer science; control theory; systems / 001D02C Artificial intelligence
- Discipline
- Computer science : theoretical automation and systems
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 19308883
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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