Development programs for 1-shot systems : Decoupled tests and redesigns, with the possibility of design degradation
- Author
- MOON, M. J1 ; VARDEMAN, S. B2 ; MCBETH, D3
[1] Linguistic Technologies Inc, St. Peter, United States
[2] Iowa State University, Ames, United States
[3] Lehman Brothers, New York, United States - Source
IEEE transactions on reliability. 1999, Vol 48, Num 2, pp 189-198 ; ref : 3 ref
- CODEN
- IEERAJ
- ISSN
- 0018-9529
- Scientific domain
- Control theory, operational research; Electronics
- Publisher
- Institute of Electrical and Electronics Engineers, New York, NY
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Conception système Coût développement Dégradation Essai Fiabilité système Optimisation Programmation dynamique Redesign cost Reliability growth System development Test cost
- Keyword (en)
- System design Development cost Degradation Test System reliability Optimization Dynamic programming
- Keyword (es)
- Concepción sistema Degradación Ensayo Fiabilidad sistema Optimización Programación dinámica
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D01 Operational research. Management science / 001D01A Operational research and scientific management / 001D01A06 Reliability theory. Replacement problems
- Discipline
- Operational research. Management
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 1945209
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1109/24.784279 
https://dx.doi.org/10.1109/24.784279
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