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The bulk high-Tc superconducting fluxgatemeter for nondestructive evaluation

Author
MIYAZAKI, M1 ; NAKANE, H1 ; ADACHI, H1
[1] Department of Electrical and Electronic Engineering, Muroran Institute of Technology, Muroran, Japan
Conference title
The 1998 Applied Superconductivity Conference. Part III
Conference name
The 1998 Applied Superconductivity Conference (ASC-98) (ASC-98) (Palm Desert, CA 1998-09-13)
Author (monograph)
Lawrence Berkeley National Laboratory, Berkeley CA, United States (Funder/Sponsor)
US Department of Energy ; Division of High Energy Physics, Washington DC, United States (Funder/Sponsor)
US Department of Energy ; Superconductivity Program for Electric Power, Washington DC, United States (Funder/Sponsor)
Mirassou Vineyards, United States (Funder/Sponsor)
Educational Institute for Superconductivity IISSC, United States (Funder/Sponsor)
Intermagnetics General Corporation, Latham NY, United States (Funder/Sponsor)
IEEE ; Committee on Applied Superconductivity, United States (Funder/Sponsor)
Source

IEEE transactions on applied superconductivity. 1999, Vol 9, Num 2, pp 3479-3482 ; 3 ; ref : 7 ref

ISSN
1051-8223
Scientific domain
Electronics; Electrical engineering
Publisher
Institute of Electrical and Electronics Engineers, New York, NY
Publication country
United States
Document type
Conference Paper
Language
English
Keyword (fr)
Capteur mesure Champ magnétique Courant électrique Evaluation performance Matériau amagnétique Méthode non destructive Niveau bruit Résultat expérimental Supraconducteur haute température Plaque aluminium
Keyword (en)
Measurement sensor Magnetic field Electric current Performance evaluation Non magnetic material Non destructive method Noise level Experimental result High temperature superconductor
Keyword (es)
Captador medida Campo magnético Corriente eléctrica Evaluación prestación Material amagnético Método no destructivo Nivel ruido Resultado experimental Supraconductor alta temperatura
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G07 General equipment and techniques / 001B00G07D Sensors (chemical, optical, electrical, movement, gas, etc.); remote sensing

Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F11 Superconducting devices

Discipline
Electronics Metrology
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
1945940

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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