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Instrumental developments in total reflection X-ray fluorescence analysis for K-lines from oxygen to the rare earth elements

Author
WOBRAUSCHEK, P; KREGSAMER, P; STRELI, C; AIGINGER, H
Österreichisch Univ., Atominst., Vienna 1020, Austria
Conference name
FACSS [Federation of analytical chemistry and spectroscopy societies]. Meeting (Chicago 1989-10-01)
Source

X-ray spectrometry. 1991, Vol 20, Num 1, pp 23-28, 6 p ; ref : 31 ref

CODEN
XRSPAX
ISSN
0049-8246
Scientific domain
Analytical chemistry; Physics
Publisher
Wiley, Chichester
Publication country
United Kingdom
Document type
Conference Paper
Language
English
Keyword (fr)
Analyse chimique Analyse trace Appareillage Limite détection Réflexion totale Spectrométrie fluorescence RX
Keyword (en)
Chemical analysis Trace analysis Instrumentation Detection limit Total reflection X ray fluorescence spectrometry
Keyword (es)
Análisis químico Análisis huella Instrumentación Límite detección Reflexión total Espectrometría fluorescencia RX
Classification
Pascal
001 Exact sciences and technology / 001C Chemistry / 001C04 Analytical chemistry / 001C04C Spectrometric and optical methods

Discipline
Analytical chemistry
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
19509736

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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