Determination of polarity in noncentrosymmetric layer/substrate systems
- Author
- MEYER, D. C1 ; RICHTER, K1 ; KRANE, H.-G2 ; MORGENROTH, W2 ; PAUFLER, P1
[1] Institut für Kristallographie und Festkörperphysik, Fachrichtung Physik der TU, 01062 Dresden, Germany
[2] Hamburger Synchrotronstrahlungslabor HASYLAB at DESY, 22603 Hamburg, Germany - Source
Journal of applied crystallography. 1999, Vol 32, pp 854-858 ; 5 ; ref : 16 ref
- CODEN
- JACGAR
- ISSN
- 0021-8898
- Scientific domain
- Crystallography
- Publisher
- Blackwell, Oxford
- Publication country
- United Kingdom
- Document type
- Article
- Language
- English
- Keyword (fr)
- Composé ternaire Couche mince Couche épitaxique Cristal non centrosymétrique Diffusion RX Diffusion anormale Dispersion énergie Etude expérimentale Etude théorique Gallium phosphure Hétéroépitaxie Indium phosphure Matériau semiconducteur Polarité (Ga,In)P Ga In P Substrat GaAs Composé minéral
- Keyword (en)
- Ternary compounds Thin films Epitaxial layers Non centrosymmetric crystals X-ray scattering Anomalous diffusion Energy dispersion Experimental study Theoretical study Gallium phosphides Heteroepitaxy Indium phosphides Semiconductor materials Polarity Inorganic compounds
- Keyword (es)
- Cristal sin centro simetría Difusión anormal Dispersión energía Heteroepitaxia Polaridad
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography / 001B60A10 X-ray diffraction and scattering / 001B60A10E X-ray scattering (including small-angle scattering)
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H55 Thin film structure and morphology / 001B60H55J Structure and morphology; thickness
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 1955628
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1107/S0021889899005920 
https://dx.doi.org/10.1107/S0021889899005920
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