Integrated microsystems in industrial applications
- Author
- FRENCH, Paddy J1
[1] EI/EWI-DIMES, TU Delft, Mekelweg 4, 2628 CD Delft, Netherlands - Conference title
- Embedded computer systems (architectures, modeling, and simulation)
- Conference name
- SAMOS 2006 (6 ; Samos 2006)
- Author (monograph)
- Vassiliadis, Stamatis (Editor); Wong, Stephan (Editor); Hämäläinen, Timo D (Editor)
- Source
Lecture notes in computer science. 2006 ; 1Vol, pp 467-476, 10 p ; ref : 29 ref
- ISSN
- 0302-9743
- ISBN
- 3-540-36410-2
- Scientific domain
- Computer science
- Publisher
- Springer, Berlin
/
Springer, New York
- Publication country
- Germany
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Attaque chimique Autotest Autoétalonnage Calculateur embarqué Capteur mesure Capteur pression Fiabilité Gyroscope
- Keyword (en)
- Chemical etching Built in self test Selfcalibration Boarded computer Measurement sensor Pressure sensor Reliability Gyroscope
- Keyword (es)
- Ataque químico Autoprueba Auto calibración Calculador embarque Captador medida Captador presión Fiabilidad Giroscopio
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits / 001D03F06B Integrated circuits by function (including memories and processors)
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 19688901
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1007/11796435_47 
https://dx.doi.org/10.1007/11796435_47
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