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Josephson junction array voltage standard at the ETL

Author
SAKAMOTO, Y; YOSHIDA, H; SAKURABA, T; ODAWARA, A; MURAYAMA, Y; ENDO, T
Electrotech. lab., Tsukuba-shi Ibaraki 305, Japan
Conference name
CPEM'90 [Conference on precision electromagnetic measurements]. 17 (Ottawa 1990-06-11)
Source

IEEE transactions on instrumentation and measurement. 1991, Vol 40, Num 2, pp 312-316, 5 p ; ref : 10 ref

CODEN
IEIMAO
ISSN
0018-9456
Scientific domain
Electronics; Physics; Telecommunications
Publisher
Institute of Electrical and Electronics Engineers, New York, NY
Publication country
United States
Document type
Conference Paper
Language
English
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00F Metrology, measurements and laboratory procedures

Discipline
Metrology
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
19712363

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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