S parameter measurements on single superconducting thin-film three-terminal devices made of high-Tc and low-Tc materials
- Autor
- MARTENS, J. S; HOHENWARTER, G. K. G; BEYER, J. B; NORDMAN, J. E; GINLEY, D. S
Univ. Wisconsin-Madison, dep. electrical computer eng., Madison WI 53706-1691, United States - Fuente
Journal of applied physics. 1989, Vol 65, Num 10, pp 4057-4060, 4 p ; ref : 7 ref
- CODEN
- JAPIAU
- ISSN
- 0021-8979
- Campo Científico
- Crystallography; Electronics; Optics; Condensed state physics; Physics
- Editor
- American Institute of Physics, Woodbury, NY
- País de la publicación
- United States
- Tipo de documento
- Article
- Idioma
- English
- Clasificación
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F11 Superconducting devices
- Disciplina
- Electronics
- Procedencia
- Inist-CNRS
- Base de datos
- PASCAL
- Identificador INIST
- 19718224
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1063/1.343332 
https://dx.doi.org/10.1063/1.343332
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