Measurement of mobility-lifetime products in amorphous semiconductors
- Author
- POLISCHUK, B; KASAP, S. O; VISWANTH AIYAH; BAILLIE, A; ABKOWITZ, M. A
Univ. Saskatchewan, dep. electrical eng., SK S7N 0W0, Canada - Conference name
- Canadian semiconductor technology conference organizers comments. 5 (Ottawa ON 1990-08)
- Source
Canadian journal of physics (Print). = Revue canadienne de physique. 1991, Vol 69, Num 3-4, pp 361-369, 9 p ; ref : 29 ref
- CODEN
- CJPHAD
- ISSN
- 0008-4204
- Scientific domain
- Optics; Atomic molecular physics; Condensed state physics; Physics
- Publisher
- National Research Council of Canada, Ottawa
- Publication country
- Canada
- Document type
- Conference Paper
- Language
- English
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70B Electronic transport in condensed matter / 001B70B20 Conductivity phenomena in semiconductors and insulators / 001B70B20J Charge carriers: generation, recombination, lifetime, and trapping
- Discipline
- Physics of condensed state : electronic structure, electrical, magnetic and optical properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 19805461
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1139/p91-061 
https://dx.doi.org/10.1139/p91-061
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