A 55-ns 16-Mb DRAM with built-in self-test function using microprogram ROM
- Autor
- TAKESHIMA, T; TAKADA, M; TASAKA, K; YAMANAKA, K; KOYAMA, K; KOIKE, H; WATANABE, H; KOSHIMARU, S; MITAKE, K; KIKUCHI, W; TANIGAWA, T; MUROTANI, T; NODA, K
NEC Corp., Sagamihara-shi Kanagawa 229, Japan - Fuente
IEEE journal of solid-state circuits. 1990, Vol 25, Num 4, pp 903-911, 9 p ; ref : 7 ref
- CODEN
- IJSCBC
- ISSN
- 0018-9200
- Campo Científico
- Electronics
- Editor
- Institute of Electrical and Electronics Engineers, New York, NY
- País de la publicación
- United States
- Tipo de documento
- Article
- Idioma
- English
- Palabra clave (fr)
- Circuit intégré Circuit programmable Conception circuit Etude expérimentale Implémentation Mémoire accès direct Mémoire dynamique Mémoire morte Technologie MOS complémentaire Fonction test Test intégré
- Palabra clave (in)
- Integrated circuit Programmable circuit Circuit design Experimental study Implementation Random access memory(RAM) Dynamical storage Read only memory(ROM) Complementary MOS technology
- Palabra clave (es)
- Circuito integrado Circuito programable Concepción circuito Estudio experimental Ejecución Memoria acceso directo Memoria dinámica Memoria muerta Tecnología MOS complementario
- Clasificación
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits / 001D03F06B Integrated circuits by function (including memories and processors)
- Disciplina
- Electronics
- Procedencia
- Inist-CNRS
- Base de datos
- PASCAL
- Identificador INIST
- 19825621
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1109/4.58282 
https://dx.doi.org/10.1109/4.58282
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