Locally weighted regression and scatteer correction for near-infrared reflectance data
- Autor
- NAES, T; ISAKSSON, T; KOWALSKI, B
MATFORSK, Ås 1430, Norway - Fuente
Analytical chemistry (Washington, DC). 1990, Vol 62, Num 7, pp 664-673, 10 p ; ref : 24 ref
- CODEN
- ANCHAM
- ISSN
- 0003-2700
- Campo Científico
- Analytical chemistry
- Editor
- American Chemical Society, Washington, DC
- País de la publicación
- United States
- Tipo de documento
- Article
- Idioma
- English
- Palabra clave (fr)
- Rayonnement IR proche Réflectométrie Spectrométrie optique
- Palabra clave (in)
- Near infrared radiation Reflectometry Optical spectrometry
- Palabra clave (es)
- Radiación infrarroja cercana Reflectometría Espectrometría óptica
- Clasificación
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G57 Infrared, submillimeter wave, microwave and radiowave instruments, equipment and techniques
- Disciplina
- Metrology
- Procedencia
- Inist-CNRS
- Base de datos
- PASCAL
- Identificador INIST
- 19831792
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1021/ac00206a003 
https://dx.doi.org/10.1021/ac00206a003
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