Molecularly and atomically thin semiconductor and carbon nanoshells
- Autor
- PRINZ, V. Ya1 ; SELEZNEV, V. A1
[1] Institute of Semiconductor Physics Russian Academy of Sciences, Akademician Lavrentyev Avenue 13, 630090 Novosibirsk, Russian Federation - Titulo de la conferencia
- Electronic properties of novel nanostructures: with contributions from the 21st International Winterschool/Euroconference on Electronic Properties of Novel Materials, Kirchberg, Tirol, Austria, 10-17 March 2007
- Nombre de la conferencia
- IWEPNM 2007 : International Winterschool/Euroconference on Electronic Properties of Novel Materials (21 ; Kirchberg 2007-03-10)
- Autor ( monografía)
- KUZMANY, Hans (Editor)1 ; DINSE, Peter (Editor)2 ; ROTH, Siegmar (Editor)3 ; THOMSEN, Christian (Editor)4
Universität Wien, Austria (Organiser of meeting)
Verein zur Förderung der Internationalen Winterschulen in Kirchberg, Austria (Organiser of meeting)
MEFS Co. Ltd, Nagano-city, Japan (Organiser of meeting)
[1] Fakultät für Physik, Universität Wien, Strudlhofgasse 4, 1090 Wien, Austria
[2] Institut für Physikalische Chemie, Technische Universität Darmstadt, Petersenstrasse 20, 64287 Darmstadt, Germany
[3] Max-Planck-Institut für Festkörperforschung, Heisenbergstrasse 1, 70569 Stuttgart, Germany
[4] Institut für Festkörperphysik, PN 5-4, Technische Universität Berlin, Hardenbergstrasse 36, 10623 Berlin, Germany - Fuente
Physica status solidi. B. Basic research. 2007, Vol 244, Num 11, pp 4193-4198, 6 p ; ref : 25 ref
- CODEN
- PSSBBD
- ISSN
- 0370-1972
- Campo Científico
- Crystallography; Electronics; Nanotechnologies, nanostructures, nanoobjects; Condensed state physics
- Editor
- Wiley, Berlin
- País de la publicación
- Germany
- Tipo de documento
- Conference Paper
- Idioma
- Russian
- Palabra clave (fr)
- Analyse structurale Couche mince Flexion Graphite Graphène Microscopie force atomique Modèle 3 dimensions Nanocoque Semiconducteur
- Palabra clave (in)
- Structural analysis Thin films Bending Graphite Graphene Atomic force microscopy Three dimensional model Nanoshell Semiconductor materials
- Palabra clave (es)
- Análisis estructural Graphene Modelo 3 dimensiones Nanocascarón
- Clasificación
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A07 Nanoscale materials and structures: fabrication and characterization
- Disciplina
- Physics and materials science
- Procedencia
- Inist-CNRS
- Base de datos
- PASCAL
- Identificador INIST
- 19886069
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1002/pssb.200776196 
https://dx.doi.org/10.1002/pssb.200776196
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