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A unified carrier-based model for undoped symmetric double-gate and surrounding-gate MOSFETs

Author
JIN HE1 2 3 ; LINING ZHANG1 ; JIAN ZHANG1 ; YUE FU1 ; RUI ZHENG1 ; MANSUN CHAN3
[1] The Hub of Multi-Project-Wafer (MPW), Institute of Microelectronics, School of Electronic Engineering and Computer Sciences, Peking University, Beijing 100871, China
[2] School of Computer and Information Engineering, Peking University Shenzhen Graduate School, Shenzhen 518055, China
[3] Department of Electronic and Computer Engineering, Hong Kong University of Science and Technology, Clearwater Bay, Kowloon, Hong-Kong
Source

Semiconductor science and technology. 2007, Vol 22, Num 12, pp 1312-1316, 5 p ; ref : 16 ref

CODEN
SSTEET
ISSN
0268-1242
Scientific domain
Electronics; Optics; Condensed state physics
Publisher
Institute of Physics, Bristol
Publication country
United Kingdom
Document type
Article
Language
English
Keyword (fr)
Equation Poisson Evaluation performance Méthode numérique Transistor MOS Transistor MOSFET Transistor grille double Transistor multigrille
Keyword (en)
Poisson equation Performance evaluation Numerical method MOS transistor MOSFET Dual gate transistor Multiple gate transistor
Keyword (es)
Ecuación Poisson Evaluación prestación Método numérico Transistor MOS Transistor de compuerta doble Transistor de rejilla múltiple
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F04 Transistors

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
19913207

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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