Statistical constraints in nanocrystal memory scaling
- Author
- GUSMEROLI, Riccardo1 ; MONZIO COMPAGNONI, Christian1 ; SPINELLI, Alessandro S1
[1] Dipartimento di Elettronica e Informazione, Politecnico di Milano -IU. NET, 20133 Milano, Italy - Source
Microelectronic engineering. 2007, Vol 84, Num 12, pp 2869-2874, 6 p ; ref : 20 ref
- CODEN
- MIENEF
- ISSN
- 0167-9317
- Scientific domain
- Electronics
- Publisher
- Elsevier Science, Amsterdam
- Publication country
- Netherlands
- Document type
- Article
- Language
- English
- Author keyword
- Flash memories Microelectronic scaling Nanocrystal memories Semiconductor device modeling
- Keyword (fr)
- Circuit intégré Contrainte électrique Courant fuite Dispositif semiconducteur Effet contrainte Facteur rétention Loi probabilité Microélectronique Modélisation Mémoire flash Mémoire non volatile Méthode Monte Carlo Nanocristal Nanoélectronique Seuil tension Simulation numérique
- Keyword (en)
- Integrated circuit Electric stress Leakage current Semiconductor device Stress effects Retention factor Probability distribution Microelectronics Modeling Flash memory Non volatile memory Monte Carlo method Nanocrystal Nanoelectronics Voltage threshold Numerical simulation
- Keyword (es)
- Circuito integrado Tensión eléctrica Corriente escape Dispositivo semiconductor Factor retención Ley probabilidad Microelectrónica Modelización Memoria flash Memoria no volátil Método Monte Carlo Nanocristal Nanoelectrónica Umbral tensión Simulación numérica
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits / 001D03F06A Design. Technologies. Operation analysis. Testing
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits / 001D03F06B Integrated circuits by function (including memories and processors)
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F18 Molecular electronics, nanoelectronics
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 19916667
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/j.mee.2007.02.009 
https://dx.doi.org/10.1016/j.mee.2007.02.009
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