Modelling and simulation of reliability for design
- Author
- MATHEWSON, A1 ; O'SULLIVAN, P1 ; CONCANNON, A1 ; FOLEY, S1 ; MINEHANE, S1 ; DUANE, R1 ; PALSER, K1
[1] National Microelectronics Research Centre, University College Cork, Lee Maltings, Prospect Row, Cork, Ireland - Conference title
- MIGAS International Summer School on Advanced Microelectronics-Grenoble, Proceedings of the Third Session Reliability in VLSI Circuits: Operation, Manufacturing and Design, June 28-July 4, 1999, Autrans, France
- Conference name
- MIGAS International Summer School on Advanced Microelectronics-Grenoble. Session (3 ; Autrans 1999-06-28)
- Author (monograph)
- REIMBOLD, Gilles (Editor)1 ; BOUSSEY, Jumana (Editor)2
MIGAS, Grenoble, France (Funder/Sponsor)
[1] CEA-LETI, France
[2] LPCS-Elésa, France - Source
Microelectronic engineering. 1999, Vol 49, Num 1-2, pp 95-117 ; ref : 107 ref
- CODEN
- MIENEF
- ISSN
- 0167-9317
- Scientific domain
- Electronics
- Publisher
- Elsevier Science, Amsterdam
- Publication country
- Netherlands
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Circuit intégré Conception Distribution contrainte Fiabilité Fonctionnelle Modélisation Procédé fabrication Simulation numérique
- Keyword (en)
- Integrated circuit Design Stress distribution Reliability Functional Modeling Manufacturing process Numerical simulation
- Keyword (es)
- Circuito integrado Diseño Campo restricción Fiabilidad Funciónal Modelización Procedimiento fabricación Simulación numérica
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03B Testing, measurement, noise and reliability
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits / 001D03F06A Design. Technologies. Operation analysis. Testing
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F17 Microelectronic fabrication (materials and surfaces technology)
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 1992344
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/S0167-9317(99)00432-3 
https://dx.doi.org/10.1016/S0167-9317(99)00432-3
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