Ellipsometer analysis in the n-k plane
- Autor
- BARTON, D1 ; URBAN, F. K1
[1] Florida International University, Miami, FL 33199, United States - Titulo de la conferencia
- Proceedings of the 34th International Conference on Metallurgical Coatings and Thin Films, San Diego, California, April 23-27, 2007
- Nombre de la conferencia
- ICMCTF 2007 International Conference on Metallurgical Coatings and Thin Films (34 ; San Diego, California 2007-04-23)
- Autor ( monografía)
- PAULEAU, Yves (Editor)1 ; STEWARD, Alan (Editor)2 ; ERDEMIR, Ali (Editor)3 ; MAYRHOFER, Paul (Editor)4 ; INSPEKTOR, Aharon (Editor)5
American Vacuum Society (AVS), Advanced Surface Engineering Division (ASED), New York, NY 10005, United States (Organiser of meeting)
[1] National Polytechnic Institute of Grenoble, CNRS-GEEL, B.P. 166, 25 rue des Martyrs, 38042 Grenoble, France
[2] Boeing Directed Energy Systems, 8531 Fallbrook Avenue, West Hills, CA 91304, United States
[3] Argonne National Laboratory, Building 212, Room D-222, 9700 South Cass Avenue, Argonne, IL 60439, United States
[4] Montanuniversität Leoben, Franz Josef Strasse 18, 8700 Leoben, Austria
[5] Kennametal, Inc. Corporate Technology Center, PO Box 231, Latrobe, PA 15650, United States - Fuente
Thin solid films. 2007, Vol 516, Num 2-4, pp 119-127, 9 p ; ref : 6 ref
- CODEN
- THSFAP
- ISSN
- 0040-6090
- Campo Científico
- Crystallography; Electronics; Metallurgy, welding; Condensed state physics
- Editor
- Elsevier Science, Lausanne
- País de la publicación
- Switzerland
- Tipo de documento
- Conference Paper
- Idioma
- English
- Palabra clave de autor
- Ellipsometry Optical measurement Thin film
- Palabra clave (fr)
- Algorithme Couche mince Ellipsométrie Méthode analytique Méthode moindre carré Méthode optique Polarisation optique Simulation numérique Simulation ordinateur Surface réfléchissante 6837
- Palabra clave (in)
- Algorithms Thin films Ellipsometry Analytical method Least square fit Optical method Optical polarization Digital simulation Computerized simulation Reflecting surface
- Palabra clave (es)
- Método analítico Método óptico Superficie reflexiva
- Clasificación
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography / 001B60A16 Electron, ion, and scanning probe microscopy
- Disciplina
- Physics of condensed state : structure, mechanical and thermal properties
- Procedencia
- Inist-CNRS
- Base de datos
- PASCAL
- Identificador INIST
- 19925441
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/j.tsf.2007.06.080 
https://dx.doi.org/10.1016/j.tsf.2007.06.080
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