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Motion of hydrogen ions in the proton memory

Author
GIRAULT, V1 ; DEVINE, R. A. B1
[1] France Telecom-CNET, BP 98, 38243 Meylan, France
Conference title
Amorphous and crystalline insulating thin films II
Conference name
International Conference on Amorphous and Crystalline Insulating Thin Films (2 ; Hong Kong 1998-10-12)
Author (monograph)
WILSON, I. H (Editor)1 ; DEVINE, R. A. B (Editor)2
[1] Department of Electronic Engineering, The Chinese University of Hong Kong, Hong Kong, China
[2] France Telecom, CNET, Meylan, France
Source

Journal of non-crystalline solids. 1999, Vol 254, pp 57-65 ; ref : 14 ref

CODEN
JNCSBJ
ISSN
0022-3093
Scientific domain
Crystallography; Chemical industry parachemical industry; Metallurgy, welding; Condensed state physics
Publisher
Elsevier, Amsterdam
Publication country
Netherlands
Document type
Conference Paper
Language
English
Keyword (fr)
Champ électrique Etude théorique Hydrogène ion Mouvement particule Mémoire non volatile Proton Transistor MOS
Keyword (en)
Electric field Theoretical study Hydrogen ion Particle motion Non volatile memory Proton MOS transistor
Keyword (es)
Campo eléctrico Estudio teórico Hidrógeno ión Movimiento partícula Memoria no volátil Protón Transistor MOS
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F04 Transistors

Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F17 Microelectronic fabrication (materials and surfaces technology)

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
1992708

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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