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Monitoring temperature and pressure over surfaces using sensitive paints

Author
ASCENCION GUERRERO-VIRAMONTES, J1 ; HERNANDEZ, David Moreno1 ; SANTOYO, Fernando Mendoza1 ; MORAN LOZA, José Miguel2 ; GARCIA ARREOLA, Alicia2
[1] Centro de Investigaciones en Optica, A.C., Departamento de Metrología Ôptica, Loma del Bosque 115, Lomas del Campestre, 37150, León, Gto, Mexico
[2] CUCEI, Universidad de Guadalajara, Jalisco, Mexico
Conference title
Optics in industry (Sixth Symposium)
Conference name
Symposium on Optics in Industry (6 ; Monterrey 2007)
Author (monograph)
Gutiérrez-Vega, Julio C (Editor); Dávila-Rodríguez, Josué (Editor); López-Mariscal, Carlos (Editor)
Centro de Óptica, Tecnólogico de Monterrey, Mexico (Organiser of meeting)
Sociedad Mexicana de Física, División de Óptica, Mexico (Organiser of meeting)
Academia Mexicana de Optica, Mexico (Organiser of meeting)
Society of Photo-optical Instrumentation Engineers, Mexico Chapter, Mexico (Organiser of meeting)
Society of photo-optical instrumentation engineers, United States (Organiser of meeting)
Source

Proceedings of SPIE, the International Society for Optical Engineering. 2007 ; 1Vol, pp 64220H.1-64220H.6 ; ref : 9 ref

CODEN
PSISDG
ISSN
0277-786X
ISBN
978-0-8194-6532-0
Scientific domain
Electronics; Metrology and instrumentation; Optics; Physics
Publisher
SPIE, Bellingham, Wash
Publication country
United States
Document type
Conference Paper
Language
English
Keyword (fr)
Analyse surface Application industrielle Etalonnage Mesure pression Mesure température Méthode mesure Méthode optique Peinture 0760
Keyword (en)
Surface analysis Industrial application Calibration Pressure measurement Temperature measurement Measuring methods Optical method Paints
Keyword (es)
Aplicación industrial Método óptico
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G60 Optical instruments, equipment and techniques

Discipline
Metrology
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
19938838

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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