Statistical Model for Random Telegraph Noise in Flash Memories
- Author
- MONZIO COMPAGNONI, Christian1 ; GUSMEROLI, Riccardo1 ; SPINELLI, Alessandro S1 2 ; LACAITA, Andrea L1 2 ; BONANOMI, Mauro3 ; VISCONTI, Angelo3
[1] Dipartimento di Elettronica e Informazione, Politecnico di Milano, 20133 Milan, Italy
[2] Instituto di Fotonica e Nanotecnologie-Consiglio Nazionale delle Ricerche, 20133 Milan, Italy
[3] Flash Memory Group-Advanced Technology Development-Non-volatile Memory Technology Development, STMicroelectronics, 20041 Milan, Italy - Source
I.E.E.E. transactions on electron devices. 2008, Vol 55, Num 1, pp 388-395, 8 p ; ref : 18 ref
- CODEN
- IETDAI
- ISSN
- 0018-9383
- Scientific domain
- Electronics
- Publisher
- Institute of Electrical and Electronics Engineers, New York, NY
- Publication country
- United States
- Document type
- Article
- Language
- English
- Author keyword
- Flash memories random telegraph noise (RTN) semiconductor-device modeling threshold-voltage instability
- Keyword (fr)
- Approche probabiliste Bruit de télégraphe aléatoire Circuit intégré Dispositif semiconducteur Distribution statistique Modèle statistique Modélisation Mémoire flash Processus Markov Seuil tension
- Keyword (en)
- Probabilistic approach Random telegraph noise Integrated circuit Semiconductor device Statistical distribution Statistical model Modeling Flash memory Markov process Voltage threshold
- Keyword (es)
- Enfoque probabilista Ruido telegráfico errático Circuito integrado Dispositivo semiconductor Distribución estadística Modelo estadístico Modelización Memoria flash Proceso Markov Umbral tensión
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits / 001D03F06A Design. Technologies. Operation analysis. Testing
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits / 001D03F06B Integrated circuits by function (including memories and processors)
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 19953582
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1109/TED.2007.910605 
https://dx.doi.org/10.1109/TED.2007.910605
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