A numerical approach to quantify self-ordering among self-organized nanostructures
- Author
- RATTO, F1 ; JOHNSTON, T. W1 ; HEUN, S2 ; ROSEI, F1
[1] INRS Energie, Matériaux et Telecommunications, Université du Québec, 1650 Boul. Lionel Boulet, J3X 1S2 Varennes (QC), Canada
[2] NEST CNR-INFM and Scuola Normale Superiore, Piazza dei Cavalieri 7, 56126 Pisa, Italy - Source
Surface science. 2008, Vol 602, Num 1, pp 249-258, 10 p ; ref : 73 ref
- Publisher
- Elsevier Science, Amsterdam
/
Elsevier Science, Lausanne
/
Elsevier Science, New York, NY
- Publication country
- Netherlands
- Document type
- Article
- Language
- English
- Author keyword
- Growth In situ characterization Low-energy electron microscopy (LEEM) Monte Carlo simulations Nanostructures Nucleation Semiconductor-semiconductor heterostructures Silicon-germanium
- Keyword (fr)
- Autoorganisation Electron lent Germanium Hétérostructure In situ Méthode Monte Carlo Nanostructure Nucléation Semiconducteur Silicium Simulation numérique Ge Si
- Keyword (en)
- Self organization Low energy electron Germanium Heterostructures In situ Monte Carlo methods Nanostructures Nucleation Semiconductor materials Silicon Digital simulation
- Keyword (es)
- Autoorganización Electrón lento In situ
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology
- Discipline
- Physics and materials science Physics of condensed state : electronic structure, electrical, magnetic and optical properties Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 20002556
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/j.susc.2007.10.025 
https://dx.doi.org/10.1016/j.susc.2007.10.025
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