SnO2, ZnO and related polycrystalline compound semiconductors : An overview and review on the voltage-dependent resistance (non-ohmic) feature
- Author
- BUENO, Paulo R1 ; VARELA, José A1 ; LONGO, Elson1
[1] Instituto de Quimica, Universidade Estadual Paulista, P.O. Box 355, 14801-907 Araraquara, SP, Brazil - Source
Journal of the European Ceramic Society. 2008, Vol 28, Num 3, pp 505-529, 25 p ; ref : 164 ref
- ISSN
- 0955-2219
- Scientific domain
- Chemical industry parachemical industry
- Publisher
- Elsevier, Oxford
- Publication country
- United Kingdom
- Document type
- Article
- Language
- English
- Author keyword
- SnO2 Varistors ZnO
- Keyword (fr)
- Article synthèse Céramique Dépendance tension Endommagement Etude comparative Evaluation performance Joint grain Microstructure Oxyde d'étain Oxyde de zinc Perovskites Polycristal Propriété électronique Résistance électrique Varistance O Sn O Zn SnO2 ZnO
- Keyword (en)
- Review Ceramic materials Voltage dependence Damaging Comparative study Performance evaluation Grain boundary Microstructure Tin oxide Zinc oxide Perovskite type compound Polycrystal Electronic properties Resistor Varistance
- Keyword (es)
- Artículo síntesis Cerámica Deterioración Estudio comparativo Evaluación prestación Limite grano Microestructura Estaño óxido Zinc óxido Perovskitas Policristal Propiedad electrónica Resistencia eléctrica(componente) Varistancia
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03D Electronic equipment and fabrication. Passive components, printed wiring boards, connectics
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 20005571
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/j.jeurceramsoc.2007.06.011 
https://dx.doi.org/10.1016/j.jeurceramsoc.2007.06.011
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