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Simultaneous topography and tomography of latent fingerprints using full-field swept-source optical coherence tomography

Author
SATISH KUMAR DUBEY1 ; DALIP SINGH MEHTA1 ; ANAND, Arun2 ; SHAKHER, Chandra1
[1] Laser Applications and Holography Laboratory, Instrument Design Development Centre, Indian Institute of Technology Delhi, Hauz Khas, New Delhi-110 016, India
[2] Institute for Plasma Research, Bhat, Gandhinagar, 382428, India
Source

Journal of optics. A, Pure and applied optics (Print). 2008, Vol 10, Num 1 ; 015307.1 ; ref : 31 ref

ISSN
1464-4258
Scientific domain
Optics
Publisher
Institute of Physics, Bristol
Publication country
United Kingdom
Document type
Article
Language
English
Author keyword
Fourier transform fingerprinting selective filtering swept-source OCT
Keyword (fr)
Aspect médicolégal Diode superluminescente Diode électroluminescente Empreinte digitale Filtre accordable Filtre acoustooptique Frange interférence Image tridimensionnelle Interférométrie optique Reconstruction image Surface réfléchissante Topographie Transformation Fourier 0760L 4230W Tomographie optique cohérente
Keyword (en)
Forensic aspect Superluminescent diodes Light emitting diodes Fingerprint Tunable filter Acousto-optical filters Interference fringe Tridimensional image Light interferometry Image reconstruction Reflecting surface Topography Fourier transformation Optical coherent tomopgraphy
Keyword (es)
Aspecto forense Huella digital Filtro sintonizable Franja interferencia Imagen tridimensional Superficie reflexiva
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G60 Optical instruments, equipment and techniques / 001B00G60L Interferometers

Pascal
001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B30 Imaging and optical processing / 001B40B30W Image reconstruction; tomography

Discipline
Metrology Physics : optics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
20028191

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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