Reflection symmetry of a sphere's internal field and its consequences on scattering : a microphysical approach
- Author
- BERG, Matthew J1 ; SORENSEN, Christopher M1 ; CHAKRABARTI, Amitabha1
[1] Department of Physics, Kansas State University, Manhattan, Kansas, 66506-2601, United States - Source
Journal of the Optical Society of America. A, Optics, image science, and vision (Print). 2008, Vol 25, Num 1, pp 98-107, 10 p ; ref : 31 ref
- ISSN
- 1084-7529
- Scientific domain
- Electronics; Optics
- Publisher
- Optical Society of America, Washington, DC
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Diffusion Mie Diffusion onde électromagnétique Méthode mesure Paramètre Stokes Particule sphérique Photométrie Polarimétrie Polarisation optique 0760D 0760F 4225F 4225J
- Keyword (en)
- Mie scattering Electromagnetic wave scattering Measuring methods Stokes parameters Spherical particle Photometry Polarimetry Optical polarization
- Keyword (es)
- Partícula esférica
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G60 Optical instruments, equipment and techniques / 001B00G60D Photometers, radiometers and colorimeters
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G60 Optical instruments, equipment and techniques / 001B00G60F Polarimeters and ellipsometers
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B25 Wave optics / 001B40B25F Diffraction and scattering
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B25 Wave optics / 001B40B25J Polarization
- Discipline
- Metrology Physics : optics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 20036469
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1364/JOSAA.25.000098 
https://dx.doi.org/10.1364/JOSAA.25.000098
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